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Describes methods for measuring an eye pattern response and jitter in the time domain.
Product Details
- Edition:
- 1.0
- Published:
- 05/26/2004
- Number of Pages:
- 35
- File Size:
- 1 file , 900 KB
Connectors for electronic equipment – Tests and measurements – Part 25-6: Test 25f: Eye pattern and jitter
standard by International Electrotechnical Commission, 05/26/2004
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Describes methods for measuring an eye pattern response and jitter in the time domain.