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This part of IEC TS 62607, which is a Technical Specification, specifies sample structures for evaluating a wide range of charge carrier concentration in organic/nano materials. This specification is provided for both capacitance-voltage (C-V) measurements in metal/insulator/semiconductor stacking structures and Hall-effect measurements with the van der Pauw configuration. Criteria for choosing measurement methods of charge carrier concentration in organic semiconductor layers are also given in this document.

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Product Details

Published:

04/22/2020

ISBN(s):

9780580991981

Number of Pages:

24

File Size:

1 file , 1.6 MB

Product Code(s):

30363345, 30363345, 30363345